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- Advances in Optics of Charged Particle Analyzers: Part 2
Advances in Optics of Charged Particle Analyzers: Part 2
ISBN: 9780443317200
Leidimo metai: 2025
Leidėjas: Academic Press
Leidinio kalba: Anglų
Formatas: Kieti viršeliai
Formatas: 9×6
Leidimo metai: 2025
Leidėjas: Academic Press
Leidinio kalba: Anglų
Formatas: Kieti viršeliai
Formatas: 9×6
Aprašymas
<i>Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233</i> merges two long-running serials, <i>Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy</i>. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.
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