Scanning Nonlinear Dielectric Microscopy - Humanitas
Yasuo Cho

Scanning Nonlinear Dielectric Microscopy

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ISBN: 9780128172469
Autorius : Yasuo Cho
Leidimo metai: 2020
Leidėjas: Woodhead Publishing
Leidinio kalba: Anglų
Formatas: Minkšti viršeliai
Formatas: 9×6
<p><i>Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices </i>is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. </p> <p>The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.</p>

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